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Journals / Politeknik Dergisi / 2022 / Cilt: 25 - Sayı: 1

Characteristics of ZnO:Er Nano Thin Films Produced Different Thickness Using Different Solvent By Sol-Gel Method

Özgür ÖZTÜRK
Elif AŞIKUZUN
Zeynep Banu HACIOĞLU
Serap SAFRAN
Pages
37–45
Publication Date
2022-03-01
DOI
—
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AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

The resistivity measurement for electrical properties and transmittance measurement for optic properties have been carried out.

📌 3 Key Takeaways

🎯
Objective & Hypothesis:In this study, Er doped ZnO based semiconducting nano thin films are produced by the sol-gel technique using dip coating method which is widely used method for preparing nano size materials. 〖Zn〗_(1-x) 〖Er〗_x O thin films are prepared different coating thickness using different solvent.
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Key Findings & Data:The effect of the Er doping and film thickness on structural, electric and optic properties of the ZnO semiconducting nano thin films are investigated in detail and compared with undoped sample which prepared in same conditions.
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Conclusion & Impact:The resistivity measurement for electrical properties and transmittance measurement for optic properties have been carried out.
🔬Design:Research Article
📍Scope:Comprehensive Sample
⚙️Variables:ZnO · Thin Film · Sol-Gel Method

Abstract

In this study, Er doped ZnO based semiconducting nano thin films are produced by the sol-gel technique using dip coating method which is widely used method for preparing nano size materials. 〖Zn〗_(1-x) 〖Er〗_x O thin films are prepared different coating thickness using different solvent. The effect of the Er doping and film thickness on structural, electric and optic properties of the ZnO semiconducting nano thin films are investigated in detail and compared with undoped sample which prepared in same conditions. X-ray diffraction analysis (XRD) has been used to determine phase and lattice parameters of the semiconducting thin films and scanning electron microscope (SEM) measurements are made for microstructure properties. The resistivity measurement for electrical properties and transmittance measurement for optic properties have been carried out.

Özet

In this study, Er doped ZnO based semiconducting nano thin films are produced by the sol-gel technique using dip coating method which is widely used method for preparing nano size materials. 〖Zn〗_(1-x) 〖Er〗_x O thin films are prepared different coating thickness using different solvent. The effect of the Er doping and film thickness on structural, electric and optic properties of the ZnO semiconducting nano thin films are investigated in detail and compared with undoped sample which prepared in same conditions. X-ray diffraction analysis (XRD) has been used to determine phase and lattice parameters of the semiconducting thin films and scanning electron microscope (SEM) measurements are made for microstructure properties. The resistivity measurement for electrical properties and transmittance measurement for optic properties have been carried out.

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Cite This Article

ÖZTÜRK, Ö., AŞIKUZUN, E., HACIOĞLU, Z. B., SAFRAN, S. (2022). Characteristics of ZnO:Er Nano Thin Films Produced Different Thickness Using Different Solvent By Sol-Gel Method. Politeknik Dergisi, Cilt: 25 - Sayı: 1, 37–45. https://ajindex.com/articles/422232

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