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Cite This Article
ATICI, Y. (1995). Characterization of planar defects in SiGe/Si by TEM. Turkish Journal of Physics, Cilt: 19 - Sayı: 5, 712–717. https://ajindex.com/articles/379411
Journals / Turkish Journal of Physics / 1995 / Cilt: 19 - Sayı: 5
Characterization of planar defects in SiGe/Si by TEM
- Journal
- Turkish Journal of Physics
- Pages
- 712–717
- DOI
- —
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