Journals / Selçuk Üniversitesi Fen Edebiyat Fakültesi Fen Dergisi / 2000 / Cilt: 1 - Sayı: 17

Determination of refractive index and extinction coefficient of thin film selenium by ellipsometry technique

İnce film selenyumun kırılma indisinin ve sönüm katsayısının elipsometrik yöntemle tayini

Pages
111–117
DOI
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AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

It was found that the results are in agreement with the literature.

📌 3 Key Takeaways

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Objective & Hypothesis:In this study, refractive index and extinction coefficient of thin film selenium, prepared by evaporation method on a glass substrate were determined by ellipsometry technique.
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Key Findings & Data:By using a monochromator, several measurements were performed for different wavelengths in the visible region and various incidence angles and the results obtained were analysed by a computer program.
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Conclusion & Impact:It was found that the results are in agreement with the literature.
🔬Design:Research Article
📍Scope:Comprehensive Sample
⚙️Variables:Domain Parameters

Abstract

In this study, refractive index and extinction coefficient of thin film selenium, prepared by evaporation method on a glass substrate were determined by ellipsometry technique. By using a monochromator, several measurements were performed for different wavelengths in the visible region and various incidence angles and the results obtained were analysed by a computer program. It was found that the results are in agreement with the literature.

Özet

Bu çalışmada, bir cam alttabaka üzerine buharlaştırma yöntemiyle elde edilen selenyum ince filmin optik sabitleri (kırılma inidisi ve sönüm katsayısı) elipsometri yöntemiyle belirlenmiştir. Yapılan çalışmada bir monokromatör yardımıyla görünür bölgedeki değişik dalga boyları ve gelme açıları için ölçümler yapılmış, bulunan deneysel parametreler bilgisayar ortamında değerlendirilerek selenyum ince filmin kırılma indisi ve sönüm katsayısı belirlenmiştir. Bulunan sonuçların literatür ile uyum içerisinde olduğu görülmüştür.

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Cite This Article

ÇELİK, G., ŞAFAK, H. (2000). Determination of refractive index and extinction coefficient of thin film selenium by ellipsometry technique. Selçuk Üniversitesi Fen Edebiyat Fakültesi Fen Dergisi, Cilt: 1 - Sayı: 17, 111–117. https://ajindex.com/articles/317657