Since the device can switch from high resolution mode to high contrast mode very quickly, it is suitable for versatile use and is suitable for examining and analyzing both materials and various biological samples.
📌 3 Maddede Bu Makale
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Amaç & Hipotez:Transmission Electron Microscopy (TEM) is used for the simultaneous determination of micro/nano and crystal structure of inorganic and organic materials.
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Temel Bulgular & Veri:Devices with lanthanum hexaboride (LaB6) electron gun operating under accelerating voltage in the range of 40-200 kV are particularly suitable for imaging biological, polymeric and nano-structured materials in high resolution (HR) or high contrast (HC) mode.
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Sonuç & Katkı:Since the device can switch from high resolution mode to high contrast mode very quickly, it is suitable for versatile use and is suitable for examining and analyzing both materials and various biological samples.
🔬Tür:Araştırma Makalesi
📍Kapsam:Genişletilmiş Akademik Örneklem
⚙️Değişkenler:Electron Microscope · Transmission Electron Microscopy (TEM) · Inorganic and organic material
Abstract
Transmission Electron Microscopy (TEM) is used for the simultaneous determination of micro/nano and crystal structure of inorganic and organic materials. Devices with lanthanum hexaboride (LaB6) electron gun operating under accelerating voltage in the range of 40-200 kV are particularly suitable for imaging biological, polymeric and nano-structured materials in high resolution (HR) or high contrast (HC) mode. The device can switch from search mode (viewing the on-screen camera) to high-quality, full-size image capture mode (main camera mode) with the push of a button, allowing quick snapshots of the selected area. Since the device can switch from high resolution mode to high contrast mode very quickly, it is suitable for versatile use and is suitable for examining and analyzing both materials and various biological samples.
Orhan, Z. (2021). TRANSMISSION ELECTRON MICROSCOPE (TEM). The World of Biomedical Technology, Cilt: 1 Sayı: 1, 11–13. https://ajindex.com/articles/978205
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Williams, D. B., & Carter, C. B. (1996). Transmission electron microscopy Plenum Press. New York and London.
Karakulak, T. (2010). GaAs/AlGaAs tabanlı kuantum kuyularının TEM (geçirimli elektron mikroskobu) ile analizi (Doctoral dissertation, Anadolu University (Turkey)).
Williams, D. B., & Carter, C. B. (1996). Transmission electron microscopy Plenum Press. New York and London.
Kuru, H. (2010). GaAs/AlGaAs tabanlı kuantum kuyularının optiksel ve elektriksel karakterizasyonu (Master's thesis, Anadolu Üniversitesi).
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