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Dergiler / Electrica / 2008 / Cilt: 8 Sayı: 1

STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

Yasin ÖZCELEP
Ayten KUNTMAN
Hakan KUNTMAN
Sayfa
549–555
Yayın Tarihi
2012-01-02
DOI
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STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

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Amaç & Hipotez:STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
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Temel Bulgular & Veri:STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
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Sonuç & Katkı:STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
🔬Tür:Araştırma Makalesi
📍Kapsam:Genişletilmiş Akademik Örneklem
⚙️Değişkenler:Symmetrical CMOS OTA · Reliability Analysis · Statistical Methods

Abstract

STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

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Bu Makaleye Atıf Yap

ÖZCELEP, Y., KUNTMAN, A., KUNTMAN, H. (2012). STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. Electrica, Cilt: 8 Sayı: 1, 549–555. https://ajindex.com/articles/1017585

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Kaynakça (13)

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  8. Prentice-Hall, Inc., Englewood Cliffs, New Jersey,1992.
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  10. McGraw-Hill Companies, Inc., Boston, 1997.
  11. Kapur, K.C., and Lamberson, L.R.,, Reliability in Engineering Design, pp 8- 30, John Wiley & Sons, New York,1977.
  12. MacDiarmid, Preston; Morris, Seymour; et. al., Reliability Toolkit: Commercial Practices Edition, pp 35-39, Reliability Analysis Center and Rome Laboratory, Rome,NewYork. G. Duzenli, Development of MOSFET models suitable for simulation of analog CMOS circuits after hot-carrier stress. Ph.D. Thesis, Institute of Science and Technology, Istanbul Technical University; 2003.
  13. Y. Özcelep, A. Kuntman, H. Kuntman ‘On The Reliability of Symmetrical CMOS OTA Operating in Subthreshold Region’, Proceedings of MELECON'06: The 13th IEEE Mediterranean Electrotechnical Conference, pp.191-194, 16-19 May 2006, Benalmádena, Málaga, Spain. Y. Özcelep, “Determination of reliability conditions in MOS transistors with fast aging”, Msc Thesis, Institute of Sciences, Istanbul University, 2004.