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Journals / Electrica / 2008 / Cilt: 8 Sayı: 1

STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

Yasin ÖZCELEP
Ayten KUNTMAN
Hakan KUNTMAN
Journal
Electrica
Pages
549–555
Publication Date
2012-01-02
DOI
—
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STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

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Objective & Hypothesis:STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
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Key Findings & Data:STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
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Conclusion & Impact:STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
🔬Design:Research Article
📍Scope:Comprehensive Sample
⚙️Variables:Symmetrical CMOS OTA · Reliability Analysis · Statistical Methods

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STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

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Cite This Article

ÖZCELEP, Y., KUNTMAN, A., KUNTMAN, H. (2012). STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. Electrica, Cilt: 8 Sayı: 1, 549–555. https://ajindex.com/articles/1017585

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