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Journals / Düzce Üniversitesi Bilim ve Teknoloji Dergisi / 2019 / Cilt: 7 - Sayı: 3

Structural, Morphological, Optical and Electrical Analysis of Fluorine Doped Tin Oxide Thin Films Fabricated by Ultrasonic Spray Pyrolysis

Ultrasonik Sprey Piroliz ile Üretilen Flor Katkılı Kalay Oksit İnce Filmlerin Yapısal, Morfolojik, Optiksel ve Elektriksel Analizleri

Durmuş Ali ALDEMİR
Murat KALELİ
Ahmet Buğrahan BAYRAM
Celal Alp YAVRU
Pages
2107–2115
Publication Date
2022-10-12
DOI
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AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

The resistivity of the thin films was found to be as 1.35×10-3W-cm.

📌 3 Key Takeaways

🎯
Objective & Hypothesis:In this study, Fluorine doped Tin Oxide (FTO) thin films with high transparency were fabricated by ultrasonic spray pyrolysis technique, successfully.
📊
Key Findings & Data:X-ray diffraction patterns showed that the films were polycrystalline and grow along to preferred orientation of (200).
💡
Conclusion & Impact:The resistivity of the thin films was found to be as 1.35×10-3W-cm.
🔬Design:Research Article
📍Scope:Comprehensive Sample
⚙️Variables:Flor katkılı Kalay Oksit · Ultrasonik sprey piroliz · Fiziksel özellikler

Abstract

In this study, Fluorine doped Tin Oxide (FTO) thin films with high transparency were fabricated by ultrasonic spray pyrolysis technique, successfully. The analyses of X-ray diffraction, scanning electron microscopy and atomic force microscopy were used for the structural and morphological characterization of the thin films. X-ray diffraction patterns showed that the films were polycrystalline and grow along to preferred orientation of (200). The band gap value of 3.16 eV was obtained from UV-Vis measurements. The resistivity of the thin films was found to be as 1.35×10-3W-cm.

Özet

Bu çalışmada yüksek şeffaflığa sahip Flor katkılı Kalay Oksit ince filmleri ultrasonik sprey piroliz tekniği ile başarılı bir şekilde üretilmiştir. İnce filmlerin yapısal ve morfolojik karakterizasyonu için X-ışını kırınımı, taramalı elektron mikroskobu ve atomik kuvvet mikroskobu analizleri yapılmıştır. X-ışını kırınımı desenleri göstermiştir ki filmler polikristal haldedir ve (200) tercihli yönelimi boyunca büyümüşlerdir. 3,16 eV’luk bir band aralığı UV-Vis ölçümlerinden elde edilmiştir. İnce filmlerin öz direnci 1,35×10-3W-cm olarak bulunmuştur.

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Cite This Article

ALDEMİR, D. A., KALELİ, M., BAYRAM, A. B., YAVRU, C. A. (2022). Structural, Morphological, Optical and Electrical Analysis of Fluorine Doped Tin Oxide Thin Films Fabricated by Ultrasonic Spray Pyrolysis. Düzce Üniversitesi Bilim ve Teknoloji Dergisi, Cilt: 7 - Sayı: 3, 2107–2115. https://ajindex.com/articles/494389

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