SavedAdd your journal

Journals / Adıyaman Üniversitesi Fen Bilimleri Dergisi / 2018 / Cilt: 8 - Sayı: 2

Determination of The Thickness and Optical Constants of Polycrystalline SnO2 Thin Film by Envelope Method

Polikristal SnO2 İnce Filmin Kalınlık ve Optik Sabitlerinin Zarf Yöntemi ile Belirlenmesi

Özge ERKEN
Cebrail GÜMÜŞ
Pages
141–151
Publication Date
2022-10-12
DOI
—
🏛️Bibliographic metadata and full text access for this article are provided via DergiPark.
DergiPark Record ↗
✨

AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

The thickness (t) and optical energy gap(Eg) of the SnO2 thin film were found to be 1.22 μm and 3.98 eV, respectively.

📌 3 Key Takeaways

🎯
Objective & Hypothesis:SnO2 (tin dioxide) thin film was deposited on commercial glass substrate by spraypyrolysis technique at 420o C.
📊
Key Findings & Data:The XRD analyses indicated that the SnO2 thin film is foundto tetragonal rutile structure.
💡
Conclusion & Impact:The thickness (t) and optical energy gap(Eg) of the SnO2 thin film were found to be 1.22 μm and 3.98 eV, respectively.
🔬Design:Research Article
📍Scope:Comprehensive Sample
⚙️Variables:Domain Parameters

Abstract

SnO2 (tin dioxide) thin film was deposited on commercial glass substrate by spraypyrolysis technique at 420o C. The XRD analyses indicated that the SnO2 thin film is foundto tetragonal rutile structure. Optical transmission values (T %) of the film are the rangeof 80-96 % in the visible region and its highly transparent. The absorption coefficients(α) were defined from transmission spectrum. Refractive indices (n) and film thickness(t) were determined from interferences of the optical transmission curve with envelopemethod. The refractive indices (n) were altered between 1.83-1.97 in the ultravioletvisible-near-infrared(UV-VIS-NIR) regions. The thickness (t) and optical energy gap(Eg) of the SnO2 thin film were found to be 1.22 μm and 3.98 eV, respectively.

Özet

SnO2 (kalay dioksit) ince film ticari cam alttaban üzerinde 420o C’de püskürtme tekniği ile depolanmıştır. XRD analizleri SnO2 ince filmin tetragonal rutil yapıya sahip olduğunu göstermiştir. Filmin optik geçirgenlik değerleri (% T) görünür bölgede % 80- 96 aralığındadır ve son derece şeffaftır. Soğurma katsayıları (α) geçirgenlik spektrumundan hesaplanmıştır. Kırılma indisleri (n) ve film kalınlığı (t) zarf yöntemi kullanılarak optik geçirgenlik eğrisinin girişimlerinden belirlenmiştir. Ultraviyolegörünür-yakın kızılötesi (UV-VIS-NIR) bölgelerinde kırılma indisleri (n) 1.83-1.97 aralığında değişmiştir. SnO2 ince filmin kalınlığı (t) ve optik enerji aralığı, sırasıyla 1.22 μm ve 3.98 eV olarak bulunmuştur.

🔖

Cite This Article

ERKEN, Ö., GÜMÜŞ, C. (2022). Determination of The Thickness and Optical Constants of Polycrystalline SnO2 Thin Film by Envelope Method. Adıyaman Üniversitesi Fen Bilimleri Dergisi, Cilt: 8 - Sayı: 2, 141–151. https://ajindex.com/articles/428500

📄 Full Text PDF Viewer

📄

PDF görüntüleyici hazırlanıyor...

References (13)

  1. Howari, H., Tomsah, I.B.I., Structural, optical and ellipsometric characteristics of PVD synthesized SnO2 thin films on Pt coated silicon wafers, Optik, 144, 467-474, 2017.
  2. Al-Jawad, S.M.H., Influence of multilayer deposition on characteristics of nanocrystalline SnO2 thin films produce by sol-gel technique for gas sensor application, Optik, 146, 17-26, 2017.
  3. Deva Arun Kumar, K., Valanarasu, S., Kathalingam, A., Jeyadheepan, K., Nd3+ Doping effect on the optical and electrical properties of SnO2 thin films prepared by nebulizer spray pyrolysis for opto-electronic application, Mater. Res. Bull., 101, 264- 271, 2018.
  4. Chen, Y., Meng, Q., Zhang, L., Han, C., Gao, H., Zhang, Y., Yan, H., SnO2- based electron transporting layer materials for perovskite solar cells: A review of recent progress, J. Energy Chem., 35, 144-167, 2019.
  5. Abendroth, T., Schumm, B., Alajlan, S.A., Almogbel, A.M., Mäder, G., Härtel, P., Althues, H., Kaskel, S., Optical and thermal properties of transparent infrared blocking antimony doped tin oxide thin films, Thin Solid Films, 624, 152-159, 2017.
  6. Ammari, A., Trari, M., Bellal, B., Zebbar, N., Effect of Sb doping on the transport and electrochemical properties of partially amorphous SnO2 thin films, J. Electroanal. Chem., 823, 638-646, 2018.
  7. Tao, H., Ma, Z., Yang, G., Wang, H., Long, H., Zhao, H., Qin, P., Fan, G., Room-temperature processed tin oxide thin film as effective hole blocking layer for planar perovskite solar cells, Appl. Surf. Sci., 434, 1336-1343, 2018.
  8. Zhang, X., Liu, X., Ning, H., Yuan, W., Deng, Y., Zhang, X., Wang, S., Wang, J., Yao, R., Peng, J., Characterization studies of the structure and properties of Zr-doped SnO2 thin films by spin-coating technique, Superlattices Microstruct., 123, 330-337, 2018.
  9. Lajnef, M., Ezzaouia, H., Chtourou, R., Optical characterization of InAs film grown on SnO2 substrate by the electrodeposition technique, J. Phys. D: Appl. Phys., 41, 125302-125305, 2008.
  10. El Radaf, I.M., Hameed, T.A., El Komy, G.M, Dahy, T.M., Synthesis, structural, linear and nonlinear optical properties of chromium doped SnO2 thin films, Ceram. Int., 45, 3072-3080, 2019.
  11. Gumus, C., Ulutas, C., Ufuktepe, Y., Optical and structural properties of manganese sulfide thin films, Opt. Mater., 29, 1183-1187, 2007.
  12. Kim, T.W., Lee, D.U., Coho, D.C., Yoon, Y.S., Microstructural and optical properties of SnO2 thin films grown on heavily doped n-InP (100) substrates, Appl. Phys. Lett., 79, 2187-2189, 2001.
  13. Swanepoel, R., Determinatio