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Journals / Balıkesir Üniversitesi Fen Bilimleri Enstitüsü Dergisi / 2012 / Cilt: 14 - Sayı: 2

Investigations on Optical, Electrical and Surface Properties of In doped CdS Films

In Katkılı CdS Filmlerinin Optik, Elektrik ve Yüzey Özelliklerinin İncelenmesi

Seniye KARAKAYA
Olcay GENÇYILMAZ
Ömer ÖZBAŞ
Pages
52–58
Publication Date
2012-12-01
DOI
—
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AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

Atomic force microscope (AFM) images have been taken to see the effect of In doping on surface topography

📌 3 Key Takeaways

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Objective & Hypothesis:CdS films have been used in optoelectronic devices and heterojunction solar cells.
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Key Findings & Data:In this work, CdS and In doped CdS films (at the In percentages of 2 and 8) have been deposited onto glass substrates at 300±5 C by ultrasonic spray pyrolysis technique.
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Conclusion & Impact:Atomic force microscope (AFM) images have been taken to see the effect of In doping on surface topography
🔬Design:Research Article
📍Scope:Comprehensive Sample
⚙️Variables:CdS:In films · atomic force microscopy · UV spectrophotometer

Abstract

CdS films have been used in optoelectronic devices and heterojunction solar cells. In this work, CdS and In doped CdS films (at the In percentages of 2 and 8) have been deposited onto glass substrates at 300±5 C by ultrasonic spray pyrolysis technique. Electrical resistivity of films has been determined by four-probe technique. Optical properties and thicknesses of the films have been examined by spectroscopic ellipsometry (SE). Transmission and absorbance spectra have been taken by UV spectrophotometer. Atomic force microscope (AFM) images have been taken to see the effect of In doping on surface topography

Özet

CdS filmleri, optoelektronikde ve heteroeklem güneş pillerinde kullanılmaktadır. Bu çalışmada, CdS ve In katkılı CdS filmleri (% 2, 8) ultrasonik kimyasal püskürtme tekniğiyle 300±5 C’de cam tabanlar üzerine depolanmıştır. Filmlerin elektriksel özdirençleri dört uç tekniği kullanılarak belirlenmiştir. Filmlerin kalınlıkları ve optik özellikleri spektroskopik elipsometre (SE) cihazı ile incelenmiştir. UV spektrofotometre cihazı ile geçirgenlik ve soğurma spektrumları alınmıştır. Atomik kuvvet mikroskobu (AKM) ile CdS filmlerinin yüzey topografisi üzerine In katkısının etkisi incelenmiştir

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Cite This Article

KARAKAYA, S., GENÇYILMAZ, O., ÖZBAŞ, Ö. (2012). Investigations on Optical, Electrical and Surface Properties of In doped CdS Films. Balıkesir Üniversitesi Fen Bilimleri Enstitüsü Dergisi, Cilt: 14 - Sayı: 2, 52–58. https://ajindex.com/articles/250983

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