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Journals / Osmaniye Korkut Ata Üniversitesi Fen Bilimleri Enstitüsü Dergisi / 2026 / Cilt: 8 Sayı: 2

Optical, Structural and Morphological Properties of Ni Doped α-Fe2O3 Thin Film Grown by RF and DC Magnetron Co-Sputtering Technique

RF ve DC Magnetron Püskürtme Tekniği ile Büyütülmüş Ni Katkılı α-Fe2O3 İnce Filmin Optik, Yapısal ve Morfolojik Özellikleri

Maryam Abdolahpour Salari(ATATÜRK ÜNİVERSİTESİ, FEN FAKÜLTESİ, FİZİK BÖLÜMÜ)0009-0002-1199-5632
Günay Merhan Muğlu(ATATÜRK ÜNİVERSİTESİ, HINIS MESLEK YÜKSEKOKULU)0000-0002-4664-1482
Volkan Şenay(BAYBURT ÜNİVERSİTESİ, BAYBURT SAĞLIK HİZMETLERİ MESLEK YÜKSEKOKULU)0000-0002-6579-2737
Sevda Sarıtaş(ATATÜRK ÜNİVERSİTESİ, İSPİR HAMZA POLAT MESLEK YÜKSEKOKULU)0000-0002-7274-3968
Pages
580–597
Publication Date
2025-03-12
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AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

Additionally, AFM images revealed a low RMS roughness value, indicating a smooth surface for the Ni-doped Fe2O3 thin layer.

📌 3 Key Takeaways

🎯
Objective & Hypothesis:In this research, Ni-doped hematite (α-Fe2O3) thin film was synthesized on glass substrate using direct current (DC) and radio frequency (RF) magnetron co-sputtering technique and some physical properties were investigated.
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Key Findings & Data:Optical, structural and morphological analysis of the obtained Ni-doped α-Fe2O3 thin film was determined using UV-VIS spectroscopy, EDX, X-ray diffraction, scanning electron microscopy (SEM) and atomic force microscopy (AFM).
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Conclusion & Impact:Additionally, AFM images revealed a low RMS roughness value, indicating a smooth surface for the Ni-doped Fe2O3 thin layer.
🔬Design:Araştırma Makalesi
📍Scope:Comprehensive Sample
⚙️Variables:RF ve DC Magnetron Püskürtme · α-Fe2O3 · XRD

Abstract

In this research, Ni-doped hematite (α-Fe2O3) thin film was synthesized on glass substrate using direct current (DC) and radio frequency (RF) magnetron co-sputtering technique and some physical properties were investigated. Optical, structural and morphological analysis of the obtained Ni-doped α-Fe2O3 thin film was determined using UV-VIS spectroscopy, EDX, X-ray diffraction, scanning electron microscopy (SEM) and atomic force microscopy (AFM). Based on the absorption measurement, the band gap energy value of the thin film was estimated and the result was determined as 2.12 eV. X-ray diffraction analysis showed a nanocrystalline structure in the thin film under investigation. According to SEM image, thin film exhibits a smooth surface morphology along the substrate. Additionally, AFM images revealed a low RMS roughness value, indicating a smooth surface for the Ni-doped Fe2O3 thin layer.

Özet

Bu araştırmada, doğru akım (DC) ve radyo frekansı (RF) magnetron püskürtme tekniği kullanılarak cam alttaş üzerinde Ni katkılı hematit (α-Fe2O3) ince film sentezlenmiştir ve bazı fiziksel özellikler araştırılmıştır. Elde edilen Ni katkılı α-Fe2O3 ince filmin optik, yapısal ve morfolojik analizi, UV-VIS spektroskopisi, EDX, X-ışını kırınımı, taramalı elektron mikroskobu (SEM) ve atomik kuvvet mikroskobu kullanılarak belirlenmiştir. Absorbsiyon ölçümüne dayanarak ince filmin bant aralığı enerji değeri hesap edilmiştir ve sonuç 2,12 eV olarak belirlenmiştir. X-ışını kırınım analizi, incelenen ince filmin nanokristal bir yapıya sahip olduğunu göstermiştir. SEM görüntüsüne göre ince film alttaş boyunca düzgün bir yüzey morfolojisi sergilemiştir. Ayrıca AFM görüntüleri, Ni:Fe2O3 ince filminin pürüzsüz bir yüzeye sahip olduğunu gösteren düşük bir RMS pürüzlülük değeri ortaya koymuştur.

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Cite This Article

Salari, M. A., Muğlu, G. M., Şenay, V., Sarıtaş, S. (2025). Optical, Structural and Morphological Properties of Ni Doped α-Fe2O3 Thin Film Grown by RF and DC Magnetron Co-Sputtering Technique. Osmaniye Korkut Ata Üniversitesi Fen Bilimleri Enstitüsü Dergisi, Cilt: 8 Sayı: 2, 580–597. https://doi.org/10.47495/okufbed.1527590

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