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Journals / Adıyaman Üniversitesi Fen Bilimleri Dergisi / 2018 / Cilt: 8 Sayı: 2

Determination of The Thickness and Optical Constants of Polycrystalline SnO_2 Thin Film by Envelope Method

Polikristal SnO_2 İnce Filmin Kalınlık ve Optik Sabitlerinin Zarf Yöntemi ile Belirlenmesi

Özge Erken(Adiyaman University)0000-0002-6493-3059
Cebrail Gümüş(Cukurova University)
Pages
141–151
Publication Date
2018-12-28
DOI
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AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

The thickness ( t ) and optical energy gap ( E g ) of the SnO 2 thin film were found to be 1.22 μ m and 3.98 eV, respectively.

📌 3 Key Takeaways

🎯
Objective & Hypothesis:SnO 2 (tin dioxide) thin film was deposited on commercial glass substrate by spray pyrolysis technique at 420 o C.
📊
Key Findings & Data:The XRD analyses indicated that the SnO 2 thin film is found to tetragonal rutile structure.
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Conclusion & Impact:The thickness ( t ) and optical energy gap ( E g ) of the SnO 2 thin film were found to be 1.22 μ m and 3.98 eV, respectively.
🔬Design:Araştırma Makalesi
📍Scope:Comprehensive Sample
⚙️Variables:Püskürtme tekniği · Zarf yöntemi · Optik sabitler

Abstract

SnO 2 (tin dioxide) thin film was deposited on commercial glass substrate by spray pyrolysis technique at 420 o C. The XRD analyses indicated that the SnO 2 thin film is found to tetragonal rutile structure. Optical transmission values ( T %) of the film are the range of 80-96 % in the visible region and its highly transparent. The absorption coefficients ( α ) were defined from transmission spectrum. Refractive indices ( n ) and film thickness ( t ) were determined from interferences of the optical transmission curve with envelope method. The refractive indices ( n ) were altered between 1.83-1.97 in the ultraviolet-visible-near-infrared (UV-VIS-NIR) regions. The thickness ( t ) and optical energy gap ( E g ) of the SnO 2 thin film were found to be 1.22 μ m and 3.98 eV, respectively.

Özet

SnO 2 (kalay dioksit) ince film ticari cam alttaban üzerinde 420 o C’de püskürtme tekniği ile depolanmıştır. XRD analizleri SnO 2 ince filmin tetragonal rutil yapıya sahip olduğunu göstermiştir. Filmin optik geçirgenlik değerleri (% T ) görünür bölgede % 80-96 aralığındadır ve son derece şeffaftır. S oğurma katsayıları ( α ) geçirgenlik spektrumundan hesaplanmıştır. Kırılma indisleri ( n ) ve film kalınlığı ( t ) zarf yöntemi kullanılarak optik geçirgenlik eğrisinin girişimlerinden belirlenmiştir. Ultraviyole-görünür-yakın kızılötesi (UV-VIS-NIR) bölgelerinde kırılma indisleri ( n ) 1.83-1.97 aralığında değişmiştir. SnO 2 ince filmin kalınlığı ( t ) ve optik enerji aralığı, sırasıyla 1.22 μ m ve 3.98 eV olarak bulunmuştur.

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Cite This Article

Erken, Ö., Gümüş, C. (2018). Determination of The Thickness and Optical Constants of Polycrystalline SnO_2 Thin Film by Envelope Method. Adıyaman Üniversitesi Fen Bilimleri Dergisi, Cilt: 8 Sayı: 2, 141–151. https://ajindex.com/articles/1352319

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