Dergiler / Turkish Journal of Physics / 1998 / Cilt: 22 - Sayı: 4
Current-Voltage Characteristics and Photoresponse of Metal Metal Devices
- Sayfa
- 315–324
- DOI
- —
Özet
Thin films (35 \AA) of Al2O3 on glass slides have been used for the fabrication of Al/Al2O3/Al, Ag/Al2O3/Al and Cu/Al2O3/Al devices. The room temperature current-voltage characteristics and the dependence of current densities of these devices at various wavelength (l) of light were measured. The results obtained on current density and photocurrent show that Al2O3 films have the potential for wider applications like antireflective coatings or treatments in photovoltaic devices, transparent insulation materials, and optical trapping surfaces in many electronic devices.
Abstract
Thin films (35 \AA) of Al2O3 on glass slides have been used for the fabrication of Al/Al2O3/Al, Ag/Al2O3/Al and Cu/Al2O3/Al devices. The room temperature current-voltage characteristics and the dependence of current densities of these devices at various wavelength (l) of light were measured. The results obtained on current density and photocurrent show that Al2O3 films have the potential for wider applications like antireflective coatings or treatments in photovoltaic devices, transparent insulation materials, and optical trapping surfaces in many electronic devices.