Dergiler / Turkish Journal of Physics / 2001 / Cilt: 25 - Sayı: 4
Computational Study for the Structural Change of the System CdTe1-x Sx Thin Film
- Sayfa
- 355–362
- DOI
- —
Özet
Polycrystalline thin film of the graded system CdTe1-xSx for x=0,0.1,\ldots,1 are prepared by using thermal evaporation technique deposited on the glass substrate with an average thickness 3000 Å for each individual value of x . XRD technique is used with the aid of a computational program to study the phase change from cubic zinc blend structure to hexagonal wurtzite with an inversion point related to the x-value. It is found that x=0.1 gives us an inversion point in the structural change from cubic to hexagonal phase.
Abstract
Polycrystalline thin film of the graded system CdTe1-xSx for x=0,0.1,\ldots,1 are prepared by using thermal evaporation technique deposited on the glass substrate with an average thickness 3000 Å for each individual value of x . XRD technique is used with the aid of a computational program to study the phase change from cubic zinc blend structure to hexagonal wurtzite with an inversion point related to the x-value. It is found that x=0.1 gives us an inversion point in the structural change from cubic to hexagonal phase.