Dergiler / Turkish Journal of Physics / 2005 / Cilt: 29 - Sayı: 2

Microstructure Characterization of ZnFe2-xMxO4 (M = Bi, Y and x = 0.1, 0.2) Ferrites by the Rietveld Refinement

Microstructure Characterization of ZnFe2−xMxO4 (M = Bi, Y and x = 0.1, 0.2) Ferrites by the Rietveld Refinement

Sayfa
85–90
DOI
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Özet

The microstructure of the ferrites was analyzed by the Reitveld refinement method. The Bi-containing ferrites revealed a decrease in the lattice parameter as the Bi3+ concentration is increased, due to the distortion of the ferrite lattice. There was a minor distortion in the ZnFe1.9Y0.1O4 ferrite lattice. A minor yttrium oxide phase coexisted with the ZnFe1.8Y0.2O4 spinel phase.

Abstract

The microstructure of the ferrites was analyzed by the Reitveld refinement method. The Bi-containing ferrites revealed a decrease in the lattice parameter as the Bi3+ concentration is increased, due to the distortion of the ferrite lattice. There was a minor distortion in the ZnFe1.9Y0.1O4 ferrite lattice. A minor yttrium oxide phase coexisted with the ZnFe1.8Y0.2O4 spinel phase.

Anahtar kelimeler: Ferrites; X-ray diffraction; lattice parameter; paramagnetic; magnetization.