Dergiler / Turkish Journal of Chemistry / 1998 / Cilt: 22 - Sayı: 3
PIXE, Particel Induced X-Ray Emission A Concise Review
- Sayfa
- 183–199
- DOI
- —
Özet
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.
Abstract
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.