X-Ray Diffraction Studies of Undoped and in-Doped Cd0.22Zn0.78S Films Deposited by Spray Pyrolysis

Özet

Cd0.22Zn0.78S and In-doped Cd0.22Zn0.78S films have been produced by the spray pyrolysis method at 275±5°C substrate temperature. This work describes the X-ray diffraction spectra of all films at room temperature. X-ray diffraction spectra of the films showed that they are hexagonal and formed as Cd0.22Zn0.78S polycrystalline structure. Film thickness, texture coefficient (TC), grain size values, lattice constants, and d% error were calculated. Effects of Indium incorporation on these properties deposited films have been systematically investigated.