Deposition and Structural Characterization of Sn-Se-Te Thin Films

Abstract

In this study, the effects of Se and Te substitution on structural and morphological properties of SnSeTe (TSeTe) thin films are studied.TSeTe thin films are fabricated by using the thermal evaporation technique. In order to determine the structural and morphologicalproperties of these films, XRD (X-ray diffraction), SEM (Scanning electron microscopy), EDXA (Energy dispersive X-Ray analysis),Raman Analysis, and AFM (Atomic Force Microscopy) measurements are carried out. Then, the effects of post-annealing on propertiesof thin films are investigated.