Preparation of thin $Bi_2Sr_2CaCu_2O_x$ (2212) film and electrical measurements

Özet

A thin film with the nominal composition of .$Bi_2Sr_2CaCu_2O_x$ (2212) was prepared on a MgO single crystal substrate by electron beam evaporation technique. The film, analyzed by x-ray diffraction, showed a preferential orientation with the c-axis prependicular to the substrate. The existence of at least two phases was seen from x-ray analysis. Electrical measurement was performed on the thin film of 2212 composition. The resistivity was confirmed to be smaller then $0.20x10^{-4}\Omega$.cm by using the van der Pauw method at 300K and critical current density was in excess of $1.2xl0^4 A/cm2$ at 38K in zero field.