Dergiler / Turkish Journal of Physics / 2001 / Cilt: 25 - Sayı: 2

Effect of Carrier Concentration Dependant Mobility on the Performance of High Electron Mobility Transistors

Sayfa
137–142
DOI
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Özet

The influence of the sheet carrier concentration dependence on mobility on the performance of High Electron Mobility Transistor (HEMT) structures is theoretically modeled. The model basically takes into account both the drift and diffusion part of the overall drain current. The normalised drain current and normalised transconductance are found to be greatly affected by the carrier concentration dependant mobility.

Abstract

The influence of the sheet carrier concentration dependence on mobility on the performance of High Electron Mobility Transistor (HEMT) structures is theoretically modeled. The model basically takes into account both the drift and diffusion part of the overall drain current. The normalised drain current and normalised transconductance are found to be greatly affected by the carrier concentration dependant mobility.

Anahtar kelimeler: Turk. J. Phys., 25, (2001), 137-142. Full text: pdf Other articles published in the same issue: Turk. J. Phys., vol.25, iss.2.

Effect of Carrier Concentration Dependant Mobility on the Performance of High Electron Mobility Transistors — AJIndex