Dergiler / Turkish Journal of Electrical Engineering and Computer Science / 2011 / Cilt: 19 - Sayı: 1
Simulation of storage time versus reverse bias current for p+n and pin diodes
- Sayfa
- 87–96
- DOI
- —
Özet
In this study, the reverse-recovery behaviors of pin and p+n diodes were simulated as a function of the reverse current and carrier lifetime. For this purpose, a 1-D simulation program was written to solve the semiconductor equations. MatLab partial differential equation solver was used. The reverse recovery response of pin and p+n diodes was obtained for various values of a resistor in series and of carrier lifetime. The transient response for voltage and current was determined.
Abstract
In this study, the reverse-recovery behaviors of pin and p+n diodes were simulated as a function of the reverse current and carrier lifetime. For this purpose, a 1-D simulation program was written to solve the semiconductor equations. MatLab partial differential equation solver was used. The reverse recovery response of pin and p+n diodes was obtained for various values of a resistor in series and of carrier lifetime. The transient response for voltage and current was determined.