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Dergiler / Istanbul University Journal of Electrical and Electronics Engineering / 2017 / Cilt: 17 - Sayı: 1

A NOVEL REVERSIBLE FAULT TOLERANT MICROPROCESSOR DESIGN IN AMS 0.35UM PROCESS

M Hüsrev CILASUN
Mustafa ALTUN
Sayfa
3147–3154
Yayın Tarihi
2022-10-18
DOI
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⚡ TL;DR(1 Cümlede Hızlı Çıkarım)

The design is simulated in ams 0.35um process and a layout is obtained for tapeout.

📌 3 Maddede Bu Makale

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Amaç & Hipotez:In this study, reversible circuits are revisited to achieve extreme soft-defect awareness in classical CMOS circuits.
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Temel Bulgular & Veri:A reversible 8-bit full adder is designed in 12-bit block code domain.
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Sonuç & Katkı:The design is simulated in ams 0.35um process and a layout is obtained for tapeout.
🔬Tür:Literatür & Derleme Çalışması
📍Kapsam:Genişletilmiş Akademik Örneklem
⚙️Değişkenler:Alan Parametreleri

Abstract

In this study, reversible circuits are revisited to achieve extreme soft-defect awareness in classical CMOS circuits. Defect models in the literature are reviewed and defect scattering is analyzed. A reversible 8-bit full adder is designed in 12-bit block code domain. As a proof of concept, a pair of reversible ALUs are embedded into a microprocessor with block-code encoded data-path. The design is simulated in ams 0.35um process and a layout is obtained for tapeout.

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Bu Makaleye Atıf Yap

CILASUN, M. H., ALTUN, M. (2022). A NOVEL REVERSIBLE FAULT TOLERANT MICROPROCESSOR DESIGN IN AMS 0.35UM PROCESS. Istanbul University Journal of Electrical and Electronics Engineering, Cilt: 17 - Sayı: 1, 3147–3154. https://ajindex.com/articles/543590

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Kaynakça (12)

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