Fingerprinting the Malfunction of Devices

Abstract

A methodology to generate fingerprints for malfunctioning devices in a system from the design information of the system is proposed. The aim is to reduce measurement to the minimum and to the simple at the expense of more computation. A simple combined cycle is considered. A baseline of fingerprints is generated by considering the degradation of one of the efficiency parameters of a single device; one degradation at a time. Different degrees of degradation are considered at different load fractions. The load fractions considered cover the range from 1 (design point) to 0.4. The degrees of degradation considered cover the range from 1 (no degradation) to 0.6, the efficiency occurring at the considered load fraction. The needed design information is stated. Examples of fingerprints are presented in tables. Application of the base-line fingerprint methodology to existing plants in general is described. Extension to multi-degraded efficiency parameters is considered guided by the baseline fingerprints.