Dergiler / International Journal of Automotive Engineering and Technologies / 2014 / Cilt: 3 - Sayı: 1

Electrostatic discharge risks in electronics used in automotive application

Sayfa
40–43
Yayın Tarihi
2022-10-18
DOI
—
🏛️Bu makalenin bibliyografik verileri ve tam metin bağlantısı DergiPark üzerinden sağlanmıştır.
DergiPark Kaydı ↗
✨

Yapay Zeka Hızlı Bakış & Çıkarımlar

AI Insight
⚡ TL;DR(1 Cümlede Hızlı Çıkarım)

Additionally, automotive product marketsoften demand Zero PPM (Parts Per Million) for overall IC product reliability that includes ESD.

📌 3 Maddede Bu Makale

🎯
Amaç & Hipotez:The automotive industry pays special attention to knowledge- based specification, design,manufacturing and qualification of components and other integrated circuits (ICs).
📊
Temel Bulgular & Veri:As a res ult, there isthe demand for ICs to be fit- for - application rather than any consideration of fit- for - standard.
💡
Sonuç & Katkı:Additionally, automotive product marketsoften demand Zero PPM (Parts Per Million) for overall IC product reliability that includes ESD.
🔬Tür:Araştırma Makalesi
📍Kapsam:Genişletilmiş Akademik Örneklem
⚙️Değişkenler:Alan Parametreleri

Abstract

The automotive industry pays special attention to knowledge- based specification, design,manufacturing and qualification of components and other integrated circuits (ICs). As a res ult, there isthe demand for ICs to be fit- for - application rather than any consideration of fit- for - standard. Thuswhen the ESD specs are stated, the rationale for the requirements needs to be understood. Therefore,we first need to consider if the ESD requirements for the automotive environment are any differentfrom other consumer product environment requirements. Additionally, automotive product marketsoften demand Zero PPM (Parts Per Million) for overall IC product reliability that includes ESD.

🔖

Bu Makaleye Atıf Yap

S, T., Thirunavukkarasu, P., Sethupathi, N. (2022). Electrostatic discharge risks in electronics used in automotive application. International Journal of Automotive Engineering and Technologies, Cilt: 3 - Sayı: 1, 40–43. https://ajindex.com/articles/540404

📄 Tam Metin PDF Okuyucu

📄

PDF görüntüleyici hazırlanıyor...

Kaynakça (3)

  1. M. P. J. Mergens, M. T. Mayerhofer, J. A. Willemen, and M. Stecher, “ESD protection considerations in advanced high- voltage technologies for automotive,” in Proc. EOS/ESD Symp., 2006, pp. 54–63
  2. R.G. Wagner, J. Soden, C.F. Hawkins, “Extent and Co st of EOS/ESD Damage In an IC Manufacturing Process”, in Proceedings of the 15th EOS/ESD Symposium, pp. 49–55 [3] D.L. Lin, “ESD Sensitivity and VLSI Technology Trends: Thermal Breakdown and Dielectric Breakdown”, in Proceedings of the 15th EOS/ESD Symposium, pp. 73 –82 [4] N. Tandan, G. Conner, “ESD Trigger Circuit”, in Proceedings of the 16th EOS/ESD Symposium, pp. 120–124 [5] C. Duvvury, R. Rountree and O. Adams, “Internal chip ESD phenomena beyond the protection circuit”, in IEEE T. Electron Dev., ED - 35, 2133 –2139 [6] T.J. Maloney and S. Dabral, “Novel Clamp Circuits for IC Power Supply Protection”, in Proc. 17th EOS/ESD Symposium, pp. 1 –12 [7] J. A. Salcedo and J. J. Liou, “A novel dual - polarity device with symmetrical/ asymmetrical S - type I− V characteristics for ESD protection design”,pp.65–67,Jan. 2006
  3. IEC 61000 - 4- 2, “Electromagnetic Compatibility (EMC) – Part 4: Testing and Measurement Techniques [9] IEC 61000 - 4- 4, “Electromagnetic Compatibility (EMC)