Dergiler / International Journal of Advances in Engineering and Pure Sciences / 2014 / Cilt: 26 - Sayı: 4

The Optical, Electrical and Surface Differences between As-Deposited and Annealed NiO Films Produced by Ultrasonic Spray Pyrolysis

Sayfa
163–172
Yayın Tarihi
2015-03-16
DOI
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Consequently, the optical, electrical and surface differences have been determined between as-deposited and annealed NiO films produced by ultrasonic spray pyrolysis.

📌 3 Maddede Bu Makale

🎯
Amaç & Hipotez:The interest in NiO films has been growing fast due to their importance in many applications in science and technology.
📊
Temel Bulgular & Veri:Also, NiO is a good candidate for p-type semiconductor films due to its wide band gap energy from 3.6 to 4.0 eV.
💡
Sonuç & Katkı:Consequently, the optical, electrical and surface differences have been determined between as-deposited and annealed NiO films produced by ultrasonic spray pyrolysis.
🔬Tür:Araştırma Makalesi
📍Kapsam:Genişletilmiş Akademik Örneklem
⚙️Değişkenler:NiO films · Atomic force microscopy · four-probe method

Abstract

The interest in NiO films has been growing fast due to their importance in many applications in science and technology. NiO films are an attractive material and are used common application area such as an antiferromagnetic layer, p-type transparent conducting film, electrochromic devices and chemical sensors. Also, NiO is a good candidate for p-type semiconductor films due to its wide band gap energy from 3.6 to 4.0 eV. In this work, NiO films have been grown on glass substrates by ultrasonic spray pyrolysis technique using NiCl2.6H2O as spraying solution. Films have been annealed at 500 °C in air during 1 h. Optical measurements of NiO film have been carried out at room temperature using a UV-VIS spectrophotometer. Band gap of as-deposited and annealed films have been calculated by using optical method and found as 3.67 eV and 3.7 eV, respectively. Thicknesses of the films have been determined by filmetrics thin film measurement system. Surface properties of the films have been investigated with an atomic force microscope and electrical resistivity measurements have been performed by a four probe set-up. Consequently, the optical, electrical and surface differences have been determined between as-deposited and annealed NiO films produced by ultrasonic spray pyrolysis.

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Bu Makaleye Atıf Yap

GENÇYILMAZ, O., ATAY, F., AKYÜZ, İ. (2015). The Optical, Electrical and Surface Differences between As-Deposited and Annealed NiO Films Produced by Ultrasonic Spray Pyrolysis. International Journal of Advances in Engineering and Pure Sciences, Cilt: 26 - Sayı: 4, 163–172. https://ajindex.com/articles/257967

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Kaynakça (12)

  1. Chopra, K.L., Major, S., Pandya, D.K., (1983). Transparent conductors-A status review. Thin Solid Films, 102(1), 1-46.
  2. He, J., Lindström, H., Hagfeldt, A., Lindquist, S.E., (1999). Dye-Sensitized Nanostructured p-Type Nickel Oxide Film as a Photocathode for a Solar Cell.Journal of Physics and Chemistry B, 103, 8940-8943.
  3. Boschloo, G., Hagfeldt, A., (2001). Spectroelectrochemistry of Nanostructured NiO. Journal of Physics and Chemistry B, 105, 3039-3044.
  4. Lu, Y.M., Hwang, W.S., Yang, J.S., (2002). Effects of substrate temperature on the resistivity of non-stoichiometric sputtered NiOx films. Surface Coating Technology,155, 231-235.
  5. Hotovy, I., Huran, J., Spiess, L., Liday, J., Sitter, H., Hascik, S., (2003). The influence of process parameters and annealing temperature on the physical properties of sputtered NiO thin films. Vacuum, 691, 237-242.
  6. Bandara, J., Divarathne, C.M., Nanayakkara, S.D., (2004). Corrigendum to ‘‘Fabrication of n–p junction electrodes made of n-type SnO2 and p-type NiO for control of charge recombination in dye-sensitized solar cells. Solar Energy Materials and Solar Cells 81, 429-437.
  7. Chan, I.M., Hong, F.C.,(2004). Improved performance of the single-layer and double- layer organic light emitting diodes by nickel oxide coated indium tin oxide anode. Thin Solid Films, 450, 304-311.
  8. Penin, N., Rougier, A., Laffont, L., Poizat, P., Tarascon, J.M., (2006). Improved cyclability by tungsten addition in electrochromic NiO thin films. Solar Energy Materials and Solar Cells, 90, 422-433.
  9. Kamal, H., Elmaghraby, E.K., Ali, S.A., Abdel-Hady, K., (2005). The electrochromic behavior of nickel oxide films sprayed at different preparative conditions. Thin Solid Films 483, 330-339.
  10. Olivier, J., Servet, B., Vergnolle, M., Mosca, M., Garry, G., (2001). Stability/instability of conductivity and work function changes of ITO thin films, UV-irradiated in air or vacuum: Measurements by the four-probe method and by Kelvin force microscopy. Synthetic Met. 122, 87-89.
  11. Fujii, E., Tomozawa, A., Torii, H., Takayama, R., (1996). Preferred Orientations of NiO Films Prepared by Plasma-Enhanced Metalorganic Chemical Vapor Deposition. Journal of Applied Physics, 35, L328-330. Sato, H., Minami, T., Takata, S., Yamada, T., (1993). Transparent conducting p-type NiO thin films prepared by magnetron sputtering. Thin Solid Films, 236 27-31.
  12. Kitao, M., Izawa, K., Urabe, K., Komatsu, T., (1994).Preparation and Electrochromic Properties of RF-Sputtered NiO Films Prepared in Ar /