Dergiler / Gazi University Journal of Science Part A: Engineering and Innovation / 2026 / Volume: 13 Issue: 2

Optical Properties of AlGaN/GaN HEMT Structures

Sayfa
—
Yayın Tarihi
2026-06-30
🏛️Bu makalenin bibliyografik verileri ve tam metin bağlantısı DergiPark üzerinden sağlanmıştır.
DergiPark Kaydı ↗
✨

Yapay Zeka Hızlı Bakış & Çıkarımlar

AI Insight
⚡ TL;DR(1 Cümlede Hızlı Çıkarım)

The Tauc method, together with the Kubelka–Munk method, was used to determine the optical band gap energy of the AlGaN layer.

📌 3 Maddede Bu Makale

🎯
Amaç & Hipotez:This study investigated the optical properties of AlGaN/GaN/sapphire high-electron-mobility transistor (HEMT) structures.
📊
Temel Bulgular & Veri:The AlGaN/GaN/sapphire HEMT structures were grown by metal-organic chemical vapour deposition (MOCVD).
💡
Sonuç & Katkı:The Tauc method, together with the Kubelka–Munk method, was used to determine the optical band gap energy of the AlGaN layer.
🔬Tür:Research Article
📍Kapsam:Genişletilmiş Akademik Örneklem
⚙️Değişkenler:HEMT · AlGaN · MOCVD

Abstract

This study investigated the optical properties of AlGaN/GaN/sapphire high-electron-mobility transistor (HEMT) structures. The AlGaN/GaN/sapphire HEMT structures were grown by metal-organic chemical vapour deposition (MOCVD). The aim of this study was to determine the optical properties, layer thicknesses, and band gap energies of the buffer layers. The Swanepoel envelope method was employed to calculate the refractive index, layer thickness, absorption coefficient, and extinction coefficient. These parameters were obtained for the transparent region as well as the weak- and medium-absorption regions. The Tauc method, together with the Kubelka–Munk method, was used to determine the optical band gap energy of the AlGaN layer.

🔖

Bu Makaleye Atıf Yap

Bilgili, A. K., Baş, Y., Sarıarslan, O., Korcak, S., Öztürk, M. K. (2026). Optical Properties of AlGaN/GaN HEMT Structures. Gazi University Journal of Science Part A: Engineering and Innovation, Volume: 13 Issue: 2. https://doi.org/10.54287/gujsa.1922780

📄 Tam Metin PDF Okuyucu

📄

PDF görüntüleyici hazırlanıyor...

Kaynakça (14)

  1. Alcaraz de la Osa, R., Iparragirre, I., Ortiz, D., & Saiz, J. M. (2019). The extended Kubelka–Munk theory and its application to spectroscopy. ChemTexts, 6(1), 2. https://doi.org/10.1007/s40828-019-0097-0
  2. Beeler, M., Trichas, E., & Monroy, E. (2013). III-nitride semiconductors for intersubband optoelectronics: a review. Semiconductor Science and Technology, 28(7), 074022. https://doi.org/10.1088/0268-1242/28/7/074022
  3. Bilgili, A. K., Akpınar, Ö., Öztürk, M. K., Başköse, C., Özçelik, S., & Özbay, E. (2019). Investigation of structural, optical and morphological properties of InGaN/GaN structure. Applied Physics A, 125(1), 36. https://doi.org/10.1007/s00339-018-2338-2
  4. Djurisic, A. B., Chan, Y., & Li, E. H. (2001). Calculations of the refractive index of AlGaN/GaN quantum well. In: Y. Arakawa, P. Blood, & M. Osinski (Eds.), Proceedings of the Symposium on Integrated Optics (20-26 January 2001, Vol. 4283, p. 630), San Jose, CA, United States. https://doi.org/10.1117/12.432616
  5. Dolgonos, A., Mason, T. O., & Poeppelmeier, K. R. (2016). Direct optical band gap measurement in polycrystalline semiconductors: A critical look at the Tauc method. Journal of Solid State Chemistry, 240, 43-48. https://doi.org/10.1016/j.jssc.2016.05.010
  6. Inbaraj, P. F. H., & Prince, J. J. (2017). Optical and structural properties of Mg doped ZnO thin films by chemical bath deposition method. Journal of Materials Science: Materials in Electronics, 29(2), 935-943. https://doi.org/10.1007/s10854-017-7991-2
  7. Mohammad, S. N., & Morkoç, H. (1996). Progress and prospects of group-III nitride semiconductors. Progress in Quantum Electronics, 20(5-6), 361-525. https://doi.org/10.1016/s0079-6727(96)00002-x
  8. Onuma, T., Chichibu, SF., Uchinuma, Y., Sota, T., Yamaguchi, S., Kamiyama, S., Amano, H., & Akasaki, I. (2003). Recombination dynamics of localized excitons in Al1−xInxN epitaxial films on GaN templates grown by metalorganic vapor phase epitaxy. Journal of Applied Physics, 94(4), 2449-2453. https://doi.org/10.1063/1.1592868
  9. Pengelly, R. S., Wood, S. M., Milligan, J. W., Sheppard, S. T., & Pribble, W. L. (2012). A Review of GaN on SiC High Electron-Mobility Power Transistors and MMICs. IEEE Transactions on Microwave Theory and Techniques, 60(6), 1764-1783. https://doi.org/10.1109/tmtt.2012.2187535
  10. Rajan, S., Waltereit, P., Poblenz, C., Heikman, S. J., Green, D. S., Speck, J. S., & Mishra, U. K. (2004). Power Performance of AlGaN–GaN HEMTs Grown on SiC by Plasma-Assisted MBE. IEEE Electron Device Letters, 25(5), 247-249. https://doi.org/10.1109/led.2004.826977
  11. Redko, R., Milenin, G., Milenin, V., Konakova, R., Redko, S., Lytvyn, P., & Babenko, O. (2019). Modification of GaN thin film on sapphire substrate optical properties under weak magnetic fields. Materials Research Express, 6(3), 036413. https://doi.org/10.1088/2053-1591/aaf612
  12. Romanov, I. S., Prudaev, I. A., Brudnyi, V. N., Kopyev, V. V., Novikov, Vad. A., Marmalyuk, A. A., Kureshov, V. A., Sabitov, D. R., & Mazalov, A. V. (2015). Effect of the Barrier Thickness on the Optical Properties of InGaN/GaN/Al2O3 (0001) LED Heterostructures. Russian Physics Journal, 58(7), 996-1000. https://doi.org/10.1007/s11182-015-0600-z
  13. Sakalauskas, E., Behmenburg, H., Hums, C., Schley, P., Rossbach, G., Giesen, C., Heuken, M., Kalisch, H., Jansen, R. H., Bläsing, J., Dadgar, A., Krost, A., & Goldhahn, R. (2010). Dielectric function and optical properties of Al-rich AlInN alloys pseudomorphically grown on GaN. Journal of Physics D: Applied Physics, 43(36), 365102. https://doi.org/10.1088/0022-3727/43/36/365102
  14. Swanepoel, R. (1983). Determination of the thickness and optical constants of amorphous silicon. Journal of Physics E: Scientific Instruments, 16(12), 1214-1222. https://doi.org/10.1088/0022-3735/16/12/023