EFFECT OF DIFFERENT THICKNESS AND SOLUTION CONCENTRATION ON CUS THIN FILM GROWN BY SILAR METHOD

Abstract

In this study, CuS thin films were successfully coated on glass substrate at room temperature using successive ionic layer absorption and reaction (SILAR) method. Thickness and solution concentration parameters which are important in SILAR management were used to obtain CuS thin films. X-Ray diffraction spectroscopy (XRD), Scanning Electron Microscopy (SEM) / Energy Spread X-ray Spectroscopy (EDX) were used to examine the changes in thickness and solution concentration in the structure of CuS thin films. Because of the investigations, it was found that CuS thin films improved both the number of cycles and the concentration of the solution and that the crystal structure improved and the SEM / EDX results supported this result.