Journals / Turkish Journal of Chemistry / 1998 / Cilt: 22 - Sayı: 4
Electron Spectroscopy for Material Characterization
- Journal
- Turkish Journal of Chemistry
- Pages
- 309–319
- DOI
- —
Abstract
Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.
Özet
Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.