Computational study for the structural change of the system $CdTe_{1-x}Sx $thin film

Özet

Polycrystalline thin film of the graded system $CdTe_{1-x}S_x$ for $x=0,0.1,\ldots,1$ are prepared by using thermal evaporation technique deposited on the glass substrate with an average thickness 3000 $\AA$ for each individual value of x . XRD technique is used with the aid of a computational program to study the phase change from cubic zinc blend structure to hexagonal wurtzite with an inversion point related to the x-value. It is found that x=0.1 gives us an inversion point in the structural change from cubic to hexagonal phase.