Improvement on The Ellis and Roberts Viability Model

Abstract

With data sets of germination percent and storage time of seed lot of wheatandsorghumstored at three different storage temperature(t, °C) with three different water content (m,%) of seeds, together with data set of buckwheat andlettuce reported in literatures, the possibility that seed survival curve were transformed into line by survival proportion and the relationship that logarithm of average viability period(logp50)and standard deviation of seed death distribution in time (?)with t,mand interaction between tand mwere analysed. Result indicated that survival proportion transformed seed survival curve to line were much easier than the probability adopted by Ellis and Roberts, and the most important factor affecting logp50and ? of seed lot was interaction betweentand m. Thus, Ellis and Roberts viability model were suggested to be improved asKi=Vi-p/10K-CWT (t×m)to predict longevity of seed lot with initial germination percent unknown, a new model of Gi/G0=A-P/10K-CWT(t×m)was constructed to predict longevity of seed lot with initial germination percent already known