Journals / Anadolu Üniversitesi Fen Fakültesi Dergisi / 2001 / Cilt: 0 - Sayı: 6

The X-ray diffraction patterns of CuInS2 semiconductor films

CuInS2 yarıiletken filminin X-ışını kırınım desenleri

Pages
117–123
Publication Date
2022-10-11
DOI
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AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

In this study,the crystal structure of CuInS2 compound semiconductor films produced by means of the spray pyrolysis method at various substrate temperatures has been investigated by x-ray diffraction pattern.

📌 3 Key Takeaways

🎯
Objective & Hypothesis:In this study,the crystal structure of CuInS2 compound semiconductor films produced by means of the spray pyrolysis method at various substrate temperatures has been investigated by x-ray diffraction pattern.
📊
Key Findings & Data:In this study,the crystal structure of CuInS2 compound semiconductor films produced by means of the spray pyrolysis method at various substrate temperatures has been investigated by x-ray diffraction pattern.
💡
Conclusion & Impact:In this study,the crystal structure of CuInS2 compound semiconductor films produced by means of the spray pyrolysis method at various substrate temperatures has been investigated by x-ray diffraction pattern.
🔬Design:Research Article
📍Scope:Comprehensive Sample
⚙️Variables:Domain Parameters

Abstract

In this study,the crystal structure of CuInS2 compound semiconductor films produced by means of the spray pyrolysis method at various substrate temperatures has been investigated by x-ray diffraction pattern.

Özet

Bu araştırmada, spray pyrolysis yöntemiyle farklı taban sıcaklıklarında elde edilen CuInS2 yarıiletken bileşiğinin x-ışını kırınım desenlerinden, kristal yapısı hakkında bilgi edinilmiştir.

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Cite This Article

AKSAY, S. (2022). The X-ray diffraction patterns of CuInS2 semiconductor films. Anadolu Üniversitesi Fen Fakültesi Dergisi, Cilt: 0 - Sayı: 6, 117–123. https://ajindex.com/articles/438642

References (7)

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