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Journals / Anadolu Üniversitesi Fen Fakültesi Dergisi / 2001 / Cilt: 0 - Sayı: 6

X-ray difraction patterns of CdIn2S4 semiconductor films

CdIn2S4 yarıiletken filmlerinin X-ışını kırınım desenleri

Metin KUL
Pages
83–92
Publication Date
2022-10-11
DOI
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AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

In this study, x-ray diffraction patterns of CdIn2S4 compound semiconductor films (at room temperature) produced by the spray pyrolysis method indicate that the films are polycrystalline.

📌 3 Key Takeaways

🎯
Objective & Hypothesis:In this study, x-ray diffraction patterns of CdIn2S4 compound semiconductor films (at room temperature) produced by the spray pyrolysis method indicate that the films are polycrystalline.
📊
Key Findings & Data:In this study, x-ray diffraction patterns of CdIn2S4 compound semiconductor films (at room temperature) produced by the spray pyrolysis method indicate that the films are polycrystalline.
💡
Conclusion & Impact:In this study, x-ray diffraction patterns of CdIn2S4 compound semiconductor films (at room temperature) produced by the spray pyrolysis method indicate that the films are polycrystalline.
🔬Design:Research Article
📍Scope:Comprehensive Sample
⚙️Variables:Domain Parameters

Abstract

In this study, x-ray diffraction patterns of CdIn2S4 compound semiconductor films (at room temperature) produced by the spray pyrolysis method indicate that the films are polycrystalline.

Özet

Bu araştırmada, spray pyrolysis yöntemiyle elde edilen CdIn2S4 yarıiletken filmlerinin, oda sıcaklığında x-ışını kırınım desenlerinden, polikristal yapıya sahip oldukları görülmüştür.

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Cite This Article

KUL, M. (2022). X-ray difraction patterns of CdIn2S4 semiconductor films. Anadolu Üniversitesi Fen Fakültesi Dergisi, Cilt: 0 - Sayı: 6, 83–92. https://ajindex.com/articles/438640

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