Journals / Mathematical and Computational Applications / 2011 / Cilt: 16 - Sayı: 1

Numerical investigation of residual stresses in YBCO/CeO2/YSZ/CeO2/Ni architextured materials for coated conductors

Pages
125–135
DOI
—
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⚡ TL;DR(Too Long; Didn't Read)

Different thermal expansion coefficients and modulus of elasticity bring about the thermal stresses in the layers.

📌 3 Key Takeaways

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Objective & Hypothesis:In this study, the stress analysis of YBC0/Ce02/YSZ/Ce02/Ni architextured materials under cryogenic conditions was carried out for coated conductor applications.
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Key Findings & Data:YBC0/Ce02/YSZ/Ce02 multilayer films were fabricated on Ni tape substrate using reel-to-reel sol-gel and Pulse Laser Deposition (PLD) systems.
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Conclusion & Impact:Different thermal expansion coefficients and modulus of elasticity bring about the thermal stresses in the layers.
🔬Design:Research Article
📍Scope:Comprehensive Sample
⚙️Variables:Domain Parameters

Abstract

In this study, the stress analysis of YBC0/Ce02/YSZ/Ce02/Ni architextured materials under cryogenic conditions was carried out for coated conductor applications. YBC0/Ce02/YSZ/Ce02 multilayer films were fabricated on Ni tape substrate using reel-to-reel sol-gel and Pulse Laser Deposition (PLD) systems. The mierostructural evolution of high temperature superconducting YBCO film and buffer layers with Ce02/YSZ/Ce02 configuration grown on textured Ni tape substrates were investigated by a Scanning Electron Microscope (SEM). SEM observations revealed that crack-free, pinhole-free, continuous superconducting film and buffer layers were obtained by sol-gel and PLD systems. The thermal distribution in the each layer was calculated using the classical lamination theory in the temperature range of 25 to -270°C in liquid helium media. The residual stresses occurred during the manufacturing are neglected therefore, all the residual stresses are assumed to be zero at 25°C. Different thermal expansion coefficients and modulus of elasticity bring about the thermal stresses in the layers.

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TOPARLI, M., SAYMAN, O., ÇELİK, E. (2011). Numerical investigation of residual stresses in YBCO/CeO2/YSZ/CeO2/Ni architextured materials for coated conductors. Mathematical and Computational Applications, Cilt: 16 - Sayı: 1, 125–135. https://ajindex.com/articles/279923

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References (1)

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