Journals / Süleyman Demirel Üniversitesi Fen Edebiyat Fakültesi Fen Dergisi / 2014 / Cilt: 9 - Sayı: 2

Variable-Angle Spectroellipsometric Characterization of CdS Thin Films

CdS İnce Filmlerinin Değişik Açılarda Spektroelipsometrik Karakterizasyonu

Pages
137–146
Publication Date
2014-12-31
DOI
—
🏛️Bibliographic metadata and full text access for this article are provided via DergiPark.
DergiPark Record ↗
✨

AI Summary & Key Takeaways

AI Insight
⚡ TL;DR(Too Long; Didn't Read)

Finally, the incidence angle effects were discussed on the optical properties of CdS thin films such as thickness and optical constant (refractive index and extinction coefficient)

📌 3 Key Takeaways

🎯
Objective & Hypothesis:In this work, CdS thin films produced by ultrasonic spray pyrolysis technique.
📊
Key Findings & Data:The optical properties of CdS thin films coated glass substrates were evaluated by variable-angle spectroscopic ellipsometry.
💡
Conclusion & Impact:Finally, the incidence angle effects were discussed on the optical properties of CdS thin films such as thickness and optical constant (refractive index and extinction coefficient)
🔬Design:Modeling & Simulation
📍Scope:Comprehensive Sample
⚙️Variables:CdS ince filmleri · spektroskopik elipsometre · kalınlık

Abstract

In this work, CdS thin films produced by ultrasonic spray pyrolysis technique. The optical properties of CdS thin films were investigated using spectroscopic ellipsometry and UV-VIS Spectrophotometer. The optical properties of CdS thin films coated glass substrates were evaluated by variable-angle spectroscopic ellipsometry. Variable angle spectroscopic ellipsometry was used for thickness and optical constant calculations. Multiple angle measurements were taken in the most sensitive angle of incidence region. Appropriate incident angle were obtained as experimental using graph of ψ and Δ. Cauchy-Urbach model was used to determine the thickness, refractive index and extinction coefficient for CdS thin films. Also, transmittance measurements and band gap values of the films was examined by UV-VIS spectrophotometer and optical method, respectively. Finally, the incidence angle effects were discussed on the optical properties of CdS thin films such as thickness and optical constant (refractive index and extinction coefficient)

Özet

Bu çalışmada, CdS ince filmleri ultrasonik kimyasal püskürtme tekniği kullanılarak üretildi. CdS ince filmlerinin optik özellikleri spektroskopik elipsometre ve UV-VIS spektrofotometre kullanılarak belirlendi. Cam tabanlar üzerine depolanan CdS ince filmlerinin optik özellikleri değişken açılardaki spektroskopik ellipsometre ölçüleri kullanılarak incelendi. Kalınlıkların ve optik sabitlerin hesaplamaları değişken açılardaki elipsometrik ölçümler kullanılarak yapıldı. En duyarlı gelme açısını belirlemek için çeşitli açılarda ölçümler yapıldı. Uygun gelme açısı, ï¹ ve ï„ grafikleri kullanılarak deneysel olarak elde edildi. CdS ince filmlerinin kalınlıklarını, kırılma indisi ve sönüm katsayısı değerlerini belirlemek için Cauchy-Urbach modeli kullanıldı. Ayrıca, geçirgenlik ölçümleri ve bant aralığı değerleri sırasıyla UV-VIS spektrofotometre ve optik metot kullanılarak belirlendi. Sonuç olarak, CdS ince filmlerinin kalınlık ve optik sabitler (kırılma indisi ve sönüm katsayısı) gibi optik özelikleri üzerine gelme açısının etkileri tartışılmıştır.

🔖

Cite This Article

GENÇYILMAZ, O., ATAY, F., AKYÜZ, İ. (2014). Variable-Angle Spectroellipsometric Characterization of CdS Thin Films. Süleyman Demirel Üniversitesi Fen Edebiyat Fakültesi Fen Dergisi, Cilt: 9 - Sayı: 2, 137–146. https://ajindex.com/articles/260969

📄 Full Text PDF Viewer

📄

PDF görüntüleyici hazırlanıyor...

References (14)

  1. Chu T.L., Chu S.S., 1993. Efficient thin film CdS/CdTe solar cells, Progress Photovoltaics, 1: 31-42.
  2. Davis A., Vaccoro K., Dauplaise, Waters W., Lorenzo J., 1999. Optimization of chemical bath- deposited cadmium sulfide on InP using a novel sulfur pretreatment, Journal of Electrochemical Society, 146: 1046-1053.
  3. Vigil O., Riech I., Garcia-Rocha M., Zelaya-Angle O., 1997. Characterization of defect levels in chemically deposited CdS films in The cubic-to hexagonal phase transition, Journal of Vacuum Science Technology A, 15: 2282-2286.
  4. Yu I., Isobe T., Senna M., 1995. Preparation and properties CdS thin films comprising nano-particles by a solution growth technique, Material Research Bulletin, 30: 975-985.
  5. Mahdi M.A., Hassan J.J., Kasim S.J., Ng S.S., Hassan Z., 2014. Optical properties of CdS micro/nanocrystalline structures prepared via a thermal evaporation method, Materials Science in Semiconductor Processing, 26: 87–92.
  6. Smith G. B., Ignatiev A., Zajac G., 1980. Solar Selective Black Cobalt: Preparation, Structure and Thermal Stability, Journal of Applied Physics, 51:4186-4196.
  7. Lepek M., Dogil B., Ciecholewski R., 1983.
  8. A Study of CdS thin film deposition, Thin Solid Films, 109: 103-107. Ahmed-Bitar R.N., 2000. Effect of doping and heat treatment on the photoluminescence of CdS films deposited by spray pyrolysis, Renewable Energy, 19: 579-586. Ashour A., 2003. Physical properties of spray pyrolysed CdS thin films, Turkish Journal of Physics, 27: 551-558.
  9. Mathew S., Mukerjee P.S., Vijayakumar K.P., 1995. Optical and surface properties of spray- pyrolysed CdS thin films, Thin Solid Films, 254: 278-284.
  10. Podesta A., Armani N., Saltavi G., Romeo N., Bosio A., Prato M., 2006. Influence of fluorine doping on the optical properties of CdS thin films for photovoltaic applications, Thin Solid Films, 511- 512: 448-452.
  11. Mathew S., Mukerjee P.S., Vijayakumar K.P., 1995. Optical and surface properties of spray- pyrolysed CdS thin films, Thin Solid Films, 254: 278-284.
  12. Senthil K., Mangalaraj D., Narayandass Sa.K., Adachi S., 2000. Optical constants of vacuum- evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry, Material Science Engineering B, 78: 53-58.
  13. Sridharan M., Narayandass Sa.K., Manglanaj D., Lee H.C., 2002. Characterization of vacuum evaporated polycrystalline Cd0.96Zn0.04Te thin films by XRD, Raman scattering and spectroscopic ellipsometry, Crystal Research Technology, 37:964-975.
  14. E Birgin. G., I Chambouleyron. and Martınez J. M., 1