Numerical investigation of residual stresses in YBCO/CeO2/YSZ/CeO2/Ni architextured materials for coated conductors

Özet

Türkçe Öz Yok

Abstract

In this study, the stress analysis of YBC0/Ce02/YSZ/Ce02/Ni architextured materials under cryogenic conditions was carried out for coated conductor applications. YBC0/Ce02/YSZ/Ce02 multilayer films were fabricated on Ni tape substrate using reel-to-reel sol-gel and Pulse Laser Deposition (PLD) systems. The mierostructural evolution of high temperature superconducting YBCO film and buffer layers with Ce02/YSZ/Ce02 configuration grown on textured Ni tape substrates were investigated by a Scanning Electron Microscope (SEM). SEM observations revealed that crack-free, pinhole-free, continuous superconducting film and buffer layers were obtained by sol-gel and PLD systems. The thermal distribution in the each layer was calculated using the classical lamination theory in the temperature range of 25 to -270°C in liquid helium media. The residual stresses occurred during the manufacturing are neglected therefore, all the residual stresses are assumed to be zero at 25°C. Different thermal expansion coefficients and modulus of elasticity bring about the thermal stresses in the layers.